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1

The Durability of Various Crucible Materials for Aluminum Nitride Crystal Growth by Sublimation

Liu, B., Edgar, J.H., Gu, Z., Zhuang, D., Raghothamachar, B., Dudley, M., Sarua, A., Kuball, Martin, Meyer III, H. M.

Journal:

MRS Internet Journal of Nitride Semiconductor Research

Year:

2004

Language:

english

File:

PDF, 547 KB

english, 2004

2

Barrier Layer Optimization for Enhanced GaN-on-diamond Device Cooling

Zhou, Yan, Anaya, Julian, Pomeroy, James, Sun, Huarui, Gu, Xing, Xie, Andy, Beam, Edward, Becker, Michael, Grotjohn, Timothy, Lee, Cathy, Kuball, Martin

Journal:

ACS Applied Materials & Interfaces

Year:

2017

Language:

english

File:

PDF, 1.48 MB

english, 2017

3

Low Thermal Boundary Resistance Interfaces for GaN-on-Diamond Devices

Yates, Luke, Anderson, Jonathan, Gu, Xing, Lee, Cathy, Bai, Tingyu, Mecklenburg, Matthew, Aoki, Toshihiro, Goorsky, Mark S., Kuball, Martin, Piner, Edwin L, Graham, Samuel

Journal:

ACS Applied Materials & Interfaces

Year:

2018

Language:

english

File:

PDF, 1.58 MB

english, 2018

4

Modulating the thermal conductivity in hexagonal boron nitride via controlled boron isotope concentration

Yuan, Chao, Li, Jiahan, Lindsay, Lucas, Cherns, David, Pomeroy, James W., Liu, Song, Edgar, James H., Kuball, Martin

Journal:

Communications Physics

Year:

2019

Language:

english

File:

PDF, 1.17 MB

english, 2019

5

On the discrimination between bulk and surface traps in AlGaN/GaN HEMTs from trapping characteristics

Milan Ťapajna, Jose L. Jimenez, Martin Kuball

Journal:

physica status solidi (a)

Year:

2012

Language:

english

File:

PDF, 250 KB

english, 2012

6

AlGaN/GaN HEMT device reliability and degradation evolution: Importance of diffusion processes

Martin Kuball, Milan Ťapajna, Richard J.T. Simms, Mustapha Faqir, Umesh K. Mishra

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 732 KB

english, 2011

7

Thermal Boundary Resistance Between GaN and Substrate in AlGaN/GaN Electronic Devices

Sarua, A., Hangfeng Ji, Hilton, K.P., Wallis, D.J., Uren, M.J., Martin, T., Kuball, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 271 KB

english, 2007

8

The role of surface barrier oxidation on AlGaN/GaN HEMTs reliability

Milan Ťapajna, Nicole Killat, Uttiya Chowdhury, Jose L. Jimenez, Martin Kuball

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 350 KB

english, 2012

9

Field-effect saccharide sensing using AlGaN/GaN heterostructures and boronic acid based chemical receptors

Tim A. Schuller, Martin Kuball, Stephen E. Flower, Tony D. James, John S. Fossey, Denis Marcon, Jo Das, Stefan Degroot, Marianne Germain, Andrei Sarua

Journal:

Sensors and Actuators B: Chemical

Year:

2011

Language:

english

File:

PDF, 369 KB

english, 2011

10

Time-dependent thermal crosstalk in multifinger AlGaN/GaN HEMTs and implications on their electrical performance

Athikom Manoi, James W. Pomeroy, Richard Lossy, Reza Pazirandeh, Joachim Würfl, Michael J. Uren, Trevor Martin, Martin Kuball

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 338 KB

english, 2011

11

Benchmarking of Thermal Boundary Resistance in AlGaN/GaN HEMTs on SiC Substrates: Implications of the Nucleation Layer Microstructure

Manoi, Athikom, Pomeroy, James W., Killat, Nicole, Kuball, Martin

Journal:

IEEE Electron Device Letters

Year:

2010

Language:

english

File:

PDF, 247 KB

english, 2010

12

Liquid crystal electrography: Electric field mapping and detection of peak electric field strength in AlGaN/GaN high electron mobility transistors

Möreke, Janina, Hodges, Chris, Mears, Laura L.E., Uren, Michael J., Richardson, Robert M., Kuball, Martin

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.13 MB

english, 2014

13

Intentionally Carbon-Doped AlGaN/GaN HEMTs: Necessity for Vertical Leakage Paths

Uren, Michael J., Silvestri, Marco, Casar, Markus, Hurkx, Godefridus Adrianus Maria, Croon, Jeroen A., Sonsky, Jan, Kuball, Martin

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 491 KB

english, 2014

14

Hot-Electron-Related Degradation in InAlN/GaN High-Electron-Mobility Transistors

Tapajna, Milan, Killat, Nicole, Palankovski, Vassil, Gregusova, Dagmar, Cico, Karol, Carlin, Jean-Francois, Grandjean, Nicolas, Kuball, Martin, Kuzmik, Jan

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 3.66 MB

english, 2014

15

[IEEE Device Research Conference - Santa Barbara, CA, USA (24-26 June 2002)] 60th DRC. Conference Digest Device Research Conference - Thermal management and device failure assessment of high-power AlGaN/GaN HFETs

Kuball, M., Rajasingam, S., Sarua, A., Hayes, J.M., Uren, M.J., Martin, T., Balmer, R.S., Hughes, B.T., Hilton, K.P.

Year:

2002

Language:

english

File:

PDF, 107 KB

english, 2002

16

[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Raman-IR micro-thermography tool for reliability and failure analysis of electronic devices

Sarua, A., Pomeroy, J., Kuball, M., Falk, A., Albright, G., Uren, M. J., Martin, T.

Year:

2008

Language:

english

File:

PDF, 410 KB

english, 2008

17

Enhanced colloidal stability of nanoscale zero valent iron particles in the presence of sodium silicate water glass

Honetschlägerová, Lenka, Janouškovcová, Petra, Kubal, Martin, Sofer, Zdeněk

Journal:

Environmental Technology

Year:

2015

Language:

english

File:

PDF, 591 KB

english, 2015

18

Interface State Artefact in Long Gate-Length AlGaN/GaN HEMTs

Waller, William M., Karboyan, Serge, Uren, Michael J., Lee, Kean Boon, Houston, Peter A., Wallis, David J., Guiney, Ivor, Humphreys, Colin J., Kuball, Martin

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 1.41 MB

english, 2015

19

Low thermal resistance of a GaN-on-SiC transistor structure with improved structural properties at the interface

Chen, Jr-Tai, Pomeroy, James W., Rorsman, Niklas, Xia, Chao, Virojanadara, Chariya, Forsberg, Urban, Kuball, Martin, Janzén, Erik

Journal:

Journal of Crystal Growth

Year:

2015

Language:

english

File:

PDF, 1.11 MB

english, 2015

20

Enhanced transport of Si-coated nanoscale zero-valent iron particles in porous media

HonetschlÄgerová, Lenka, Janouškovcová, Petra, Kubal, Martin

Journal:

Environmental Technology

Year:

2016

Language:

english

File:

PDF, 1.35 MB

english, 2016

21

Self-Heating Effects in High-Power AlGaN/GaN HFETs

Kuball, M., Uren, M.J., Hayes, J.M., Martin, T., Birbeck, J.C.H., Balmer, R.S., Hughes, B.T.

Journal:

MRS Proceedings

Year:

2001

Language:

english

File:

PDF, 98 KB

english, 2001

22

Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence

Brazzini, Tommaso, Casbon, Michael A., Sun, Huarui, Uren, Michael J., Lees, Jonathan, Tasker, Paul J., Jung, Helmut, Blanck, Hervé, Kuball, Martin

Journal:

Microelectronics Reliability

Year:

2015

Language:

english

File:

PDF, 1.25 MB

english, 2015

23

Measuring the thermal conductivity of the GaN buffer layer in AlGaN/GaN HEMTs

Power, Máire, Pomeroy, James W., Otoki, Yohei, Tanaka, Takeshi, Wada, Jiro, Kuzuhara, Masaaki, Jantz, Wolfgang, Souzis, Andrew, Kuball, Martin

Journal:

physica status solidi (a)

Year:

2015

Language:

english

File:

PDF, 330 KB

english, 2015

24

[IEEE 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Prague, Czech Republic (2016.6.12-2016.6.16)] 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Reverse-biased induced mechanical stress in AlGaN/GaN power diodes

Power, Maire, Pomeroy, James W., Chatterjee, Indranil, Risbud, Dilip M., Wynne, Barry, Gajda, Mark A., Sonsky, Jan, Pedrotti, Kenneth D., Uren, Michael J., Kuball, Martin

Year:

2016

Language:

english

File:

PDF, 644 KB

english, 2016

25

[IEEE 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Thermal management of GaN-on-diamond high electron mobility transistors: Effect of the nanostructure in the diamond near nucleation region

Anaya, Julian, Sun, Huarui, Pomeroy, James, Kuball, Martin

Year:

2016

Language:

english

File:

PDF, 1.20 MB

english, 2016

26

A Review of Raman Thermography For Electronic and Opto-Electronic Device Measurement with Sub-micron Spatial and Nanosecond Temporal Resolution

Kuball, Martin, Pomeroy, James W.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2016

Language:

english

File:

PDF, 1.94 MB

english, 2016

27

Thermal characterization of polycrystalline diamond thin film heat spreaders grown on GaN HEMTs

Zhou, Yan, Ramaneti, Rajesh, Anaya, Julian, Korneychuk, Svetlana, Derluyn, Joff, Sun, Huarui, Pomeroy, James, Verbeeck, Johan, Haenen, Ken, Kuball, Martin

Journal:

Applied Physics Letters

Year:

2017

Language:

english

File:

PDF, 1.50 MB

english, 2017

28

Surface Zeta Potential and Diamond Seeding on Gallium Nitride Films

Mandal, Soumen, Thomas, Evan L. H., Middleton, Callum, Gines, Laia, Griffiths, James T., Kappers, Menno J., Oliver, Rachel A., Wallis, David J., Goff, Lucy E., Lynch, Stephen A., Kuball, Martin, Willi

Journal:

Year:

2017

Language:

english

File:

PDF, 4.39 MB

english, 2017

29

Early Reconstitution of NK and Γδ T Cells and Its Implication for the Design of Post-Transplant Immunotherapy

de Witte, Moniek A., Sarhan, Dhifaf, Davis, Zachary, Felices, Martin, Vallera, Daniel A., Hinderlie, Peter, Curtsinger, Julie, Cooley, Sarah, Wagner, John, Kuball, Jurgen, Miller, Jeffrey S.

Journal:

Biology of Blood and Marrow Transplantation

Year:

2018

Language:

english

File:

PDF, 1.03 MB

english, 2018

30

Micro-Raman scattering spectroscopy study of Li-doped and undoped ZnO needle crystals

R. Jothilakshmi, V. Ramakrishnan, R. Thangavel, J. Kumar, Andrei Sarua, Martin Kuball

Journal:

Journal of Raman Spectroscopy

Year:

2009

Language:

english

File:

PDF, 194 KB

english, 2009

31

Solvent dependent study of carbonyl vibrations of 3-phenoxybenzaldehyde and 4-ethoxybenzaldehyde by Raman spectroscopy and ab initio calculations

Veerabahu Ramakrishnan, Andrei Sarua, Martin Kuball, Anis Fathima Abdullah

Journal:

Journal of Raman Spectroscopy

Year:

2009

Language:

english

File:

PDF, 411 KB

english, 2009

32

Micro-Raman analysis of GaAs Schottky barrier solar cell

R. Jothilakshmi, V. Ramakrishnan, J. Kumar, Andrei Sarua, Martin Kuball

Journal:

Journal of Raman Spectroscopy

Year:

2011

Language:

english

File:

PDF, 155 KB

english, 2011

33

The biofiltration permeable reactive barrier: Practical experience from Synthesia

Lenka Vesela, Jan Nemecek, Martina Siglova, Martin Kubal

Journal:

International Biodeterioration & Biodegradation

Year:

2006

Language:

english

File:

PDF, 326 KB

english, 2006

34

Sublimation crystal growth of yttrium nitride

Li Du, J.H. Edgar, Roberta A. Peascoe-Meisner, Yinyan Gong, Silvia Bakalova, Martin Kuball

Journal:

Journal of Crystal Growth

Year:

2010

Language:

english

File:

PDF, 1.42 MB

english, 2010

35

Comparison of electrodialytic removal of Cu from spiked kaolinite, spiked soil and industrially polluted soil

Lisbeth M. Ottosen, Katarina Lepkova, Martin Kubal

Journal:

Journal of Hazardous Materials

Year:

2006

Language:

english

File:

PDF, 287 KB

english, 2006

36

Soil flushing by surfactant solution: Pilot-scale demonstration of complete technology

Marek Svab, Martin Kubal, Martina Müllerova, Robert Raschman

Journal:

Journal of Hazardous Materials

Year:

2009

Language:

english

File:

PDF, 673 KB

english, 2009

37

Raman spectral investigation of thiourea complexes

R. Geetha Kumari, V. Ramakrishnan, M. Lydia Carolin, J. Kumar, Andrei Sarua, Martin Kuball

Journal:

Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy

Year:

2009

Language:

english

File:

PDF, 337 KB

english, 2009

38

Cadmium, lead and mercury biosorption on waste fungal biomass issued from fermentation industry. I. Equilibrium studies

Lenka Svecova, Marketa Spanelova, Martin Kubal, Eric Guibal

Journal:

Separation and Purification Technology

Year:

2006

Language:

english

File:

PDF, 942 KB

english, 2006

39

Laser lift-off transfer of AlGaN/GaN HEMTs from sapphire onto Si: A thermal perspective

Hangfeng Ji, Jo Das, Marianne Germain, Martin Kuball

Journal:

Solid-State Electronics

Year:

2009

Language:

english

File:

PDF, 318 KB

english, 2009

40

Micro-Raman spectroscopy as a voltage probe in AlGaN/GaN heterostructure devices: Determination of buffer resistances

R.J.T. Simms, M.J. Uren, T. Martin, J. Powell, U. Forsberg, A. Lundskog, A. Kakanakova-Georgieva, E. Janzén, M. Kuball

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 353 KB

english, 2011

41

High spatial resolution micro-Raman temperature measurements of nitride devices (FETs and light emitters)

M. Kuball, J. W. Pomeroy, S. Rajasingam, A. Sarua, M. J. Uren, T. Martin, A. Lell, V. Härle

Journal:

physica status solidi (a)

Year:

2005

Language:

english

File:

PDF, 293 KB

english, 2005

42

High spatial resolution micro-Raman temperature measurements of nitride devices (FETs and light emitters)

M. Kuball, J. W. Pomeroy, S. Rajasingam, A. Sarua, M. J. Uren, T. Martin, A. Lell, V. Härle

Journal:

physica status solidi (a)

Year:

2005

File:

PDF, 193 KB

2005

43

Time-resolved nanosecond sub-micron resolution thermal analysis of high-power AlGaN/GaN HFETs

M. Kuball, G. J. Riedel, J. W. Pomeroy, A. Sarua, M. J. Uren, T. Martin, K. P. Hilton, D. J. Wallis

Journal:

physica status solidi (a)

Year:

2007

Language:

english

File:

PDF, 142 KB

english, 2007

44

Direct optical measurement of hot-phonons in active AlGaN/GaN devices

J. W. Pomeroy, M. Kuball, M. J. Uren, T. Martin

Journal:

physica status solidi (b)

Year:

2008

Language:

english

File:

PDF, 223 KB

english, 2008

45

Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy

Kuball, M., Hayes, J.M., Uren, M.J., Martin, I., Birbeck, J.C.H., Balmer, R.S., Hughes, B.T.

Journal:

IEEE Electron Device Letters

Year:

2002

Language:

english

File:

PDF, 89 KB

english, 2002

46

[IEEE 10th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications. EDMO 2002 - Manchester, UK (18-19 Nov. 2002)] The 10th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications - GaN devices for microwave applications [FET/HEMT]

Uren, M.J., Barnes, A.R., Martin, T., Balmer, R.S., Hilton, K.P., Hayes, D.G., Kuball, M.

Year:

2002

Language:

english

File:

PDF, 452 KB

english, 2002

47

Fabrication of GaN nanowalls and nanowires using surface charge lithography

Veaceslav Popa, Ion Tiginyanu, Olesea Volciuc, Andrei Sarua, Martin Kuball, Peter Heard

Journal:

Materials Letters

Year:

2008

Language:

english

File:

PDF, 487 KB

english, 2008

48

Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures

Sarua, A., Hangfeng Ji, Kuball, M., Uren, M.J., Martin, T., Hilton, K.P., Balmer, R.S.

Journal:

IEEE Transactions on Electron Devices

Year:

2006

Language:

english

File:

PDF, 1.08 MB

english, 2006

49

Channel Temperature Determination in High-Power AlGaN/GaN HFETs Using Electrical Methods and Raman Spectroscopy

Simms, R.J.T., Pomeroy, J.W., Uren, M.J., Martin, T., Kuball, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2008

Language:

english

File:

PDF, 330 KB

english, 2008

50

Effects of gate shaping and consequent process changes on AlGaN/GaN HEMT reliability

Janina Möreke, Milan Ťapajna, Michael J. Uren, Yi Pei, Umesh K. Mishra, Martin Kuball

Journal:

physica status solidi (a)

Year:

2012

Language:

english

File:

PDF, 594 KB

english, 2012

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